EPF6016BC256-3 [INTEL]

FLEX 6000 devices are based on the OptiFLEX architecture, which minimizes die size while maintaining high performance and routability. The devices have reconfigurable SRAM elements, which give designers the flexibility to quickly change their designs during prototyping and design testing. Designers can also change functionality during operation via in-circuit reconfiguration. FLEX 6000 devices are reprogrammable, and they are 100% tested prior to shipment. As a result, designers are not required to generate test vectors for fault coverage purposes, allowing them to focus on simulation and design verification.